Responsible for production support engineering with respect to testing methods, procedures, engineering testing data collections, yield problems and optimizing device production relative to cost constraints. Assumes responsibility for device manufacturing testing after transfer into high volume production. Focusing on Scan/ATPG/Vmin/cell aware and/or memory MBIST related testing flow, testing program enhancement/optimization and volume engineering data collection to enable fast turn around in term of logic/scan/array yield diagnostics, FA/FI, root cause to drive CIP for yield improvement
MNCJobz.com will not be responsible for any payment made to a third-party. All Terms of Use are applicable.