Job Description

Process development tasks such as developing Scattered-Electron-Microscope (SEM) metrology models, driving the understanding of new metrology technology and measurement techniques in 3D NAND technology. Own applications and develop processes of new nodes. Identify and provide solutions for inline detection in collaboration with process engineer and process integration. Identify modeling opportunities using metrology and detection data to explain electrical failed signature at probe Collaborate with HVM Metro team on technology choices for the upcoming nodes and able to translate future technology device needs into clear equipment roadmap requirements. Work closely with the planning team to understand Model-on-record (MOR) impact of new technology. Maintain MOR accuracy to enable successful technology ramp. Bachelor's or Master's degree in Material Science, Physics, or a related field. Familiarity with electron microscopy techniques, materials characterization, and data analysis. Basic knowledge of operating and troubleshooting SEM, AFM, and other analytical tools. Strong collaboration and communication skills, with the ability to work in multidisciplinary teams. Analytical and problem-solving skills, with a focus on continuous improvement. Innovation, Tenacity, Collaboration and Customer Focus Experience with semiconductor device fabrication and characterization is a plus. Knowledge of statistical analysis and data interpretation. Familiarity with data science and machine learning is a plus.