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JR38084 INTERN - PIE RDA
Location :
1, North Coast Drive, Singapore 757432
Department :
Product Integration Engineering (PIE), Real Time Defect Analysis (RDA)
Title of project:
To develop Best Sampling Model that will maximize the return of investment and to accurate analyze the different types of RDA critical metrics
Project Description:
Real-Time Defect Analysis department plays a critical role in Yield Improvement Program by driving baseline defect reduction program and ensuring robust defect excursion control through sampling methodology. In the leading tech node in Fab10, there are hundreds of critical defects across many inspection steps (using various tools that have different cost and effectiveness) being sampled at low level to maintain low cost and fast cycle time. The sampled data will then be utilized to conduct in-depth defect data analytic, which includes estimation of defect reduction significance from defect improvement projects and excursion significance from deviation processes.\xe2\x80\x8b
Scope:
In this project, students will gain 1st hand experience to understand semiconductor processes and how defects improvements are been carried out, the various inline data collection methodologies and different electrical probe testing for defects. Students will then combine all these information to develop a Best Sampling Model that will accurately predict the defect reduction/excursion significance and the relevant optimum sampling level. Students are expected to understand the pros and cons of the various methods we have, explore statistical, deploy different Big Data Analytics techniques and conduct actual simulation to build the model. Some additional considerations will be the cost of the data collection. \xe2\x80\x8b
Deliverable:
To develop Best Sampling Model that will maximize the return of investment and to accurate analyze the different types of RDA critical metrics (different cost of data collection, varying effectiveness, wide range of mean/range/standard deviation) to output: 1) defect reduction/excursion effectiveness and confidence level; 2) Optimum sampling level required.\xe2\x80\x8b
Skillset Required :
eQuest
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